New insights into the role of native point defects in ZnO

被引:312
作者
Janotti, A [1 ]
Van de Walle, CG [1 ]
机构
[1] Univ Calif Santa Barbara, Mat Dept, Santa Barbara, CA 93106 USA
基金
美国国家科学基金会;
关键词
electronic structure; point defects in solids; wide-band-gap semiconductors;
D O I
10.1016/j.jcrysgro.2005.10.043
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Using first-principles methods based on density functional theory and pseudopotentials, we have performed a detailed study of native point defects in ZnO. Contrary to the conventional wisdom, we find that native point defects are unlikely to be the cause of the frequently observed unintentional n-type conductivity. Oxygen vacancies, which have most often been invoked as shallow donors, have high formation energies in n-type ZnO, and are actually deep donors with a very high ionization energy. Zinc interstitials are shallow donors, but have high formation energies in n-type ZnO; in addition, they are fast diffusers, and thus unlikely to be stable in n-type ZnO. Zn antisites are also shallow donors, and have even higher formation energies than zinc interstitials. They may play a role under non-equilibrium conditions such as in irradiation experiments. Zinc vacancies are deep acceptors and may act as compensating centers in n-type ZnO. Oxygen interstitials are stable in the form of electrically inactive split interstitials as well as deep acceptors at the octahedral interstitial site under n-type conditions. Our results may provide a guide to more in-depth experimental studies of point defects in ZnO and their influence on the control of doping. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:58 / 65
页数:8
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