device modeling;
SPICE model;
TCAD simulation;
tunnel FET;
tunnel FET logic gate;
DRAIN CURRENT MODEL;
GATE;
FETS;
MOSFETS;
SI;
D O I:
10.1002/jnm.2793
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
In this study, we propose a SPICE model ofp-channel silicon tunneling field-effect transistors (TFETs) for logic applications. To verify our model, electrical characteristics of fabricatedp-TFETs are calibrated by utilizing TCAD and SPICE simulations. We simulate various logic gates, such as complementary TFET (c-TFET) inverters,c-TFET NAND gates, andc-TFET NOR gates using our TFET model. Our simulation shows that ac-TFET inverter can be operated atV(DD)as low as 0.3 V and thatc-TFET logic gates based on our model can operate similar to 1000 times higher frequency than conventional TFET logic gates.
机构:
Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USAUniv Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
Khatami, Yasin
;
Banerjee, Kaustav
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USAUniv Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
机构:
Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USAUniv Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
Khatami, Yasin
;
Banerjee, Kaustav
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USAUniv Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA