Frequency Response Analysis vs. Flux Division Measurement in Detection of Transformer Winding Internal Short Circuit

被引:0
作者
Bagheri, Mehdi [1 ]
Naderi, Mohammad Salay [1 ]
Blackburn, Trevor [1 ]
Phung, B. T. [1 ]
机构
[1] UNSW, Sch EE&T, Energy Syst Grp, Sydney, NSW, Australia
来源
2012 IEEE INTERNATIONAL CONFERENCE ON POWER SYSTEM TECHNOLOGY (POWERCON) | 2012年
关键词
Frequency response analysis; Flux division measurement; Short circuit; Transformer; FRA; MOVEMENT;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Diagnosis of electrical equipment, particularly distribution and power transformers, which are considered as the heart of the electric power grid, has been quite important for quite a long time. Transformer diagnosis methods have been introduced and employed to recognize transformer internal defects since many years ago. Turn to turn and disc to disc short circuit in transformer windings are considered as one of the main problems in transformer active part. Flux Division Measurement (FDM) technique is employed specifically to realize internal short circuit in transformer windings. This test is performed as an on-site, non-destrnctive, fast and simple method to detect turn to turn or disc to disc short circuits in transformer windings. In this study, a 360 MVA, 230 kV/20 kV five-limb step up transformer has been taken as a case in order to clarify the capability of Frequency Response Analysis (FRA) in internal short circuit detection of transformer. Also, FRA tests were performed to elaborate that it is able to give further detailed information as well. Interpretation of test results on this giant transformer winding shows that FRA method is capable to provide significant information as to the healthy or defected condition of the windings.
引用
收藏
页数:5
相关论文
共 15 条
  • [1] Effect of core magnetization on frequency response analysis (FRA) of power transformers
    Abeywickrama, Nilanga
    Serdyuk, Yuriy V.
    Gubanski, Stanislaw A.
    [J]. IEEE TRANSACTIONS ON POWER DELIVERY, 2008, 23 (03) : 1432 - 1438
  • [2] Abeywickrama Nilanga, 2011, CIGRE KYOT JAP
  • [3] [Anonymous], IEEE EL INS C EIC AN
  • [4] Bagheri M., 2011, 2011 IEEE 11th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2011), P1, DOI 10.1109/SIRF.2011.5719301
  • [5] Bagheri M., 2012, CIGRE PAR F IN PRESS
  • [6] Bagheri M., 2012, IEEE T DIEL IN PRESS
  • [7] Bagheri M, 2012, CONFERENCE RECORD OF THE 2012 IEEE INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATION (ISEI), P301, DOI 10.1109/ELINSL.2012.6251477
  • [8] TRANSFORMER DIAGNOSTIC TESTING BY FREQUENCY-RESPONSE ANALYSIS
    DICK, EP
    ERVEN, CC
    [J]. IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1978, 97 (06): : 2144 - 2153
  • [9] Florkowski A, 2007, IEEE IEMDC 2007: PROCEEDINGS OF THE INTERNATIONAL ELECTRIC MACHINES AND DRIVES CONFERENCE, VOLS 1 AND 2, P590
  • [10] Florkowski Marek, 2011, 2011 IEEE 20th International Symposium on Industrial Electronics (ISIE 2011), P15, DOI 10.1109/ISIE.2011.5984129