Design and characterization of an undulator beamline optimized for small-angle coherent X-ray scattering at the Advanced Photon Source

被引：73

作者：

Sandy, AR

Lurio, LB

Mochrie, SGJ

Malik, A

Stephenson, GB

Pelletier, JF

Sutton, M

机构：

[1] MIT, Ctr Mat Sci & Engn, Cambridge, MA 02139 USA

[2] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA

[3] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1999年 / 6卷

关键词：

coherent X-ray beams; speckle; small-angle X-ray scattering (SAXS);

D O I：

10.1107/S0909049599009590

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An undulator beamline and small-angle-scattering spectrometer have been implemented at the Advanced Photon Source. The beamline is optimized for performing small-angle wide-bandpass coherent X-ray scattering measurements, and has been characterized by measuring static X-ray speckle patterns from isotropically disordered samples. Statistical analyses of the speckle patterns have been performed from which the speckle widths and contrast are extracted versus wavevector transfer and sample thickness. The measured speckle widths and contrast are compared with an approximation to the intensity correlation function and found to be in good agreement with its predictions.

引用

页码：1174 / 1184

页数：11

共 23 条

[1] Small-angle X-ray scattering using coherent undulator radiation at the ESRF [J].