The use of genetic algorithms for advanced instrument fault detection and isolation schemes

被引：0
|
作者：
Betta, G [1 ]
Liguori, C [1 ]
Pietrosanto, A [1 ]
机构：
[1] UNIV CASSINO,DEPT IND ENGN,I-03043 CASSINO,ITALY
来源：
JOINT CONFERENCE - 1996: IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE & IMEKO TECHNICAL COMMITTEE 7, CONFERENCE PROCEEDINGS, VOLS I AND II: QUALITY MEASUREMENTS: THE INDISPENSABLE BRIDGE BETWEEN THEORY AND REALITY (NO MEASUREMENTS? NO SCIENCE!) | 1996年
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
引用
收藏
页码：1129 / 1134
页数：6
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