Measurement and Fabrication Uncertainties in High-Directivity Microstrip Couplers

被引：0
|
作者：
Pham, M. Nhat [1 ]
Mueller, Johannes [2 ]
Jacob, Arne F. [1 ]
机构：
[1] Tech Univ Hamburg, Inst Hochfrequenztech, Denickestr 22, D-21073 Hamburg, Germany
[2] Elect Syst Engn GmbH, SILVER ATENA, D-21129 Hamburg, Germany
来源：
2012 42ND EUROPEAN MICROWAVE CONFERENCE (EUMC) | 2012年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The significance of experimental results obtained with couplers designed for high directivity is addressed. Two aspects are considered. First, the effect of calibration errors on the coupler directivity is investigated and the related accuracy limits are formulated on a statistical basis. Second, the directivity degradation due to fabrication tolerances is predicted by simulation and verified experimentally. This allows to relate measurement results to theoretical expectations and to draw some more general conclusions on the relative importance of these two effects.
引用
收藏
页码：479 / 482
页数：4
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