Superlattice multinanolayered thin films of SiO2/SiO2 + Ge for thermoelectric device applications

被引:10
|
作者
Budak, Satilmis [1 ]
Parker, Robert [2 ]
Smith, Cydale [3 ]
Muntele, Claudiu [4 ]
Heidary, Kaveh [1 ]
Johnson, Ralph B. [5 ]
Ila, Daryush [6 ]
机构
[1] Alabama A&M Univ, Dept Elect Engn & Comp Sci, Normal, AL 35762 USA
[2] NASA, George C Marshall Space Flight Ctr, Huntsville, AL 35812 USA
[3] Alabama A&M Univ, CIM, Normal, AL 35762 USA
[4] Cygnus Sci Serv, Huntsville, AL USA
[5] Alabama A&M Univ, Dept Phys, Normal, AL 35762 USA
[6] Fayetteville State Univ, Dept Chem & Phys, Fayetteville, NC USA
基金
美国国家科学基金会;
关键词
Ion bombardment; thermoelectric properties; transport properties; multinanolayers; figure of merit; THERMOELECTRIC PROPERTIES; EFFICIENCY; GROWTH; SIO2;
D O I
10.1177/1045389X13483022
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thermoelectric generators convert heat to electricity. Effective thermoelectric materials and devices have a low thermal conductivity and a high electrical conductivity. The performance of thermoelectric materials and devices is shown by a dimensionless figure of merit, ZT = S-2 sigma T/K, where S is the Seebeck coefficient, sigma is the electrical conductivity, T is the absolute temperature, and K is the thermal conductivity. We have prepared 100 alternating layers of SiO2/SiO2+ Ge superlattice thin films using ion beam-assisted deposition for the thermoelectric generator device application. The 5 MeV Si ion bombardments were performed using the Center for Irradiation Materials' Pelletron ion beam accelerator to form quantum dots and/or quantum clusters in the multinanolayer superlattice thin films to decrease the cross-plane thermal conductivity and increase the cross-plane Seebeck coefficient and cross-plane electrical conductivity. The thermoelectric and transport properties have been characterized for SiO2/SiO2+ Ge superlattice thin films.
引用
收藏
页码:1357 / 1364
页数:8
相关论文
共 50 条
  • [21] Ellipsometric study of crystallization of amorphous Ge thin films embedded in SiO2
    Alonso, M. I.
    Garriga, M.
    Bernardi, A.
    Goni, A. R.
    Lopeandia, A. F.
    Garcia, G.
    Rodriguez-Viejo, J.
    Labar, U.
    THIN SOLID FILMS, 2008, 516 (12) : 4277 - 4281
  • [23] Comparative study of ALD SiO2 thin films for optical applications
    Pfeiffer, Kristin
    Shestaeva, Svetlana
    Bingel, Astrid
    Munzert, Peter
    Ghazaryan, Lilit
    van Helvoirt, Cristian
    Kessels, Wilhelmus M. M.
    Sanli, Umut T.
    Grevent, Corinne
    Schuetz, Gisela
    Putkonen, Matti
    Buchanan, Iain
    Jensen, Lars
    Ristau, Detlev
    Tuennermann, Andreas
    Szeghalmi, Adriana
    OPTICAL MATERIALS EXPRESS, 2016, 6 (02): : 660 - 670
  • [24] Interface features of SiO2/SiC heterostructures according to methods for producing the SiO2 thin films
    Bacherikov, Yu. Yu.
    Boltovets, N. S.
    Konakova, R. V.
    Kolyadina, E. Yu.
    Ledn'ova, T. M.
    Okhrimenko, O. B.
    SEMICONDUCTOR PHYSICS QUANTUM ELECTRONICS & OPTOELECTRONICS, 2012, 15 (01) : 13 - 16
  • [25] RELIABILITY ISSUES CONCERNING THIN GATE SIO2 AND SIO2/SI INTERFACE FOR ULSI APPLICATIONS
    MA, TP
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 74 (1-2): : 295 - 300
  • [26] Second harmonic generation from Ge doped SiO2 (Gex(SiO2)1-x) thin films grown by sputtering
    Kawamura, Ibuki
    Imakita, Kenji
    Fujii, Minoru
    Hayashi, Shinji
    APPLIED PHYSICS LETTERS, 2013, 103 (20)
  • [27] Effects of Thermal Annealing on the Thermoelectric and Optical Properties of SiO2/SiO2+Cu Nanolayer Thin Films
    Budak, S.
    Baker, M.
    Lassiter, J.
    Smith, C.
    Muntele, C.
    Johnson, R. B.
    JOURNAL OF ELECTRONIC MATERIALS, 2015, 44 (06) : 1420 - 1425
  • [28] Effects of Thermal Annealing on the Thermoelectric and Optical Properties of SiO2/SiO2+Cu Nanolayer Thin Films
    S. Budak
    M. Baker
    J. Lassiter
    C. Smith
    C. Muntele
    R. B. Johnson
    Journal of Electronic Materials, 2015, 44 : 1420 - 1425
  • [29] TEM studies of ge nanocrystal formation in PECVD grown SiO2:Ge/SiO2 multilayers
    Agan, S.
    Dana, A.
    Aydinli, A.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2006, 18 (22) : 5037 - 5045
  • [30] Structural analysis of annealed amorphous SiO/SiO2 superlattice
    Pivac, B.
    Dubcek, P.
    Capan, I.
    Zorc, H.
    Bemstorff, S.
    Duguay, S.
    Slaoui, A.
    THIN SOLID FILMS, 2008, 516 (20) : 6796 - 6799