Batch screening of commercial serial flash-memory integrated circuits for low-temperature applications

被引：8
作者：
Ihmig, Frank R. [1 ]
Shirley, Stephen G. [1 ]
Zimmermann, Heiko [1 ,2 ]
机构：
[1] Fraunhofer Inst Biomed Techn IBMT, D-66386 Sankt Ingbert, Germany
[2] Univ Saarland, Mol & Cellular Biotechnol Nanotechnol, D-66123 Saarbrucken, Germany
来源：
CRYOGENICS | 2015年 / 71卷
关键词：
Low-temperature electronics; Cryoelectronics; Biopreservation; Flash memory; Liquid nitrogen; CMOS MICROPROCESSOR; PERFORMANCE; OPERATION;
D O I：
10.1016/j.cryogenics.2015.05.005
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
We present comprehensive results on the experimentally measured performance of commercial serial flash-memory integrated circuits (ICs) over a wide temperature range (-196 degrees C to 25 degrees C). We also address endurance issues because our intended low-temperature application is electronics related to long-term storage of biological material. We compared six batches of flash-memory ICs, manufactured between 2007 and 2012. Test results reveal a batch-to-batch variation of the pass rate. Typically, programming times increase by a factor of 4-6 at 196 degrees C. The practical relevance of our results is discussed. (C) 2015 The Authors. Published by Elsevier Ltd.
引用
收藏
页码：39 / 46
页数：8
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