Characterization of Domain Structure in One-Dimensional SrRuO3 Nanostructure using Synchrotron X-Ray Microdiffraction

SrRuO3 (SRO) thin films with a geometric shape of one-dimensional stripes can be epitaxially grown on a SrTiO3 (STO) substrate. Conventional X-ray reciprocal space map (RSM) measurements revealed that the stripes consist of multiple crystallographic domains. We performed synchrotron X-ray microdiffraction measurements to determine whether the single stripe of the SRO has a single crystallographic domain or not. Spacing between stripes is similar to 200 nm that is comparable to a beam size available for the microdiffraction. The synchrotron X-ray microdiffraction experiment was performed at BL13XU, SPring-8. RSMs of asymmetric diffractions around STO 204 reflection were measured by a broad-beam (200 x 200 mu m(2)) and the sub-micro-beam (250(h) x 190(v) nm(2)). Both SRO 260 and 620 are seen in the RSM measured by the broad-beam due to the crystallographic twinning. On the other hand, only SRO 620 is observed in the RSM measured by the sub-micro-beam. The result shows the domain length of the single stripe SRO thin film is longer than the vertical beam size of 190 nm.