Experimental Determination of the Dominant Type of Auger Recombination in InGaN Quantum Wells

被引:52
作者
Galler, Bastian [1 ]
Lugauer, Hans-Juergen [1 ]
Binder, Michael [1 ]
Hollweck, Richard [1 ]
Folwill, Yannick [1 ]
Nirschl, Anna [1 ]
Gomez-Iglesias, Alvaro [1 ]
Hahn, Berthold [1 ]
Wagner, Joachim [2 ]
Sabathil, Matthias [1 ]
机构
[1] OSRAM Opto Semicond GmbH, D-93055 Regensburg, Germany
[2] Fraunhofer Inst Appl Solid State Phys, D-79108 Freiburg, Germany
关键词
DOPED GAN; COMPENSATION; PHOTOLUMINESCENCE;
D O I
10.7567/APEX.6.112101
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigate theoretically the influence of type and density of background carriers in the active region on the quantum efficiency of InGaN-based light emitters using an extension of the ABC rate model. A method to determine experimentally whether a certain type of Auger recombination is relevant in InGaN quantum wells is derived from these considerations. Using this approach, we show that the physical process which is the dominant cause for the efficiency droop is superlinear in the electron density and can thus be assigned to nnp-Auger recombination. (C) 2013 The Japan Society of Applied Physics
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页数:4
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