Structural and Optical Properties of the Nanocrystalline ZnO Films Prepared by Successive Ionic Layer Adsorption and Reaction

被引：0

作者：

EL Hamri, E. L. Houcine ^{[1
]}

Elfanaoui, Abdeslam ^{[1
]}

Boulkadat, Lahcen ^{[1
]}

Ihalane, El Hassane ^{[1
]}

Alahyane, Lahbib ^{[1
]}

Kirou, Hassan ^{[1
]}

Bouabid, Khalid ^{[1
]}

Ihlal, Ahmed ^{[1
]}

Laanab, Larbi

机构：

[1] Univ Ibn Zohr, LMER, Dept Phys, Fac Sci, Hay Dakhla 80000, Agadir, Morocco

来源：

PROCEEDINGS OF 2013 INTERNATIONAL RENEWABLE AND SUSTAINABLE ENERGY CONFERENCE (IRSEC) | 2013年

关键词：

zinc oxide ZnO; Thin films; SlLAR; Nanostrueture; Annealing and band gap; THIN-FILMS; DEPOSITION; GROWTH; NANOSTRUCTURES;

D O I：

暂无

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

In this paper, we report on Zinc oxide (ZnO) thin films grown by means of simple and cost effective method: Successive Ionic Layer Adsorption and Reaction (SILAR). All the depositions were performed on cheap glass substrates at room temperature. Annealing temperatures and film thickness effect on the structural, morphological and optical properties of the films were investigated. The as-deposited films were annealed at 300 and 400 degrees C for 1 h under oxygen atmosphere. The X-ray diffraction (XRD) and scanning electron microscopy (SEM) characterizations showed that the films covered the whole glass substrates and exhibit the wurtzite hexagonal structure. All the films are nanostructured. The film thickness effect on the band gap values was investigated and band gap values were found to vary within the range 3.2 - 3.8 eV depending on the growth conditions.

引用

页码：36 / 39

页数：4

共 31 条

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