Polarization dependence of resonant inelastic X-ray scattering spectroscopy in correlated electron systems

被引：3
作者：
Ishihara, Sumio [1 ]
Ihara, Satoshi [1 ]
机构：
[1] Tohoku Univ, Dept Phys, Sendai, Miyagi 9808578, Japan
来源：
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 2008年 / 69卷 / 12期
基金：
日本学术振兴会;
关键词：
Oxides; X-ray diffraction; Electronic structure; Superconductivity; Magnetic properties;
D O I：
10.1016/j.jpcs.2008.06.051
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Resonant inelastic X-ray scattering (RIXS) at the transition-metal K-edge is studied as a tool to detect the electronic structure in correlated electron systems. We, in particular, focus on the polarization dependence of RIXS intensity and symmetry of the electronic excitations. it is shown that by analyzing the polarization of the initial and scattered X-rays, the symmetry of the 4p orbitals are selected. Combined effects of the polarization of X-rays and the momentum transfer in the scattering are also studied. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码：3184 / 3186
页数：3
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