Length control and sharpening of atomic force microscope carbon nanotube tips assisted by an electron beam

被引：74

作者：

Martinez, J ^{[1
]}

Yuzvinsky, TD

Fennimore, AM

Zettl, A

García, R

Bustamante, C

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Sci Mat, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[3] CSIC, Inst Microelect, Madrid 28760, Spain

来源：

NANOTECHNOLOGY | 2005年 / 16卷 / 11期

关键词：

D O I：

10.1088/0957-4484/16/11/004

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We report on the precise positioning of a carbon nanotube on an atomic force microscope (AFM) tip. By using a nanomanipulator inside a scanning electron microscope, an individual nanotube was retrieved from a metal foil by the AFM tip. The electron beam allows us to control the nanotube length and to sharpen its end. The performance of these tips for AFM imaging is demonstrated by improved lateral resolution of DNA molecules.

引用

页码：2493 / 2496

页数：4

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