Estimation of Fatigue-life of Electronic Packages Subjected to Random Vibration Load

被引:3
作者
Sakri, M. I. [1 ]
Saravanan, S. [1 ]
Mohanram, P. V. [1 ]
Abuthakeer, S. Syath [1 ]
机构
[1] PSG Coll Technol, Coimbatore 641004, Tamil Nadu, India
关键词
Dual in-line package; DIP; random vibrations; JEDEC standard; electronic package reliability;
D O I
10.14429/dsj.59.1486
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Random vibration is being specified for acceptance tests, screening tests, and qualification tests by manufacturers of electronic equipment meant for military applications, because it has been shown that random vibration more closely represents the true environment in which the electronic equipment must operate. In this paper, the methodology of testing an electronic package subjected to random vibration load is illustrated using Joint Electronic Device Engineering Council's (JEDEC) JESD22-B 103B standard. The electronic package mounted at the centre of the printed circuit board was Subjected to vibration, variable frequency condition 'D' of JEDEC standard for 30 min. After 30 min of random vibration test, the component lead-wires, solder-joints, and PCB were thoroughly inspected for failure. From the observations, it was found that no failure Occurred during the test period. The fatigue life of the component, estimated using analytical method, was found to be 96.48 hours.
引用
收藏
页码:58 / 62
页数:5
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