Automated Debugging from Pre-Silicon to Post-Silicon

被引：0

作者：

Dehbashi, Mehdi ^{[1
]}

Fey, Goerschwin ^{[1
]}

机构：

[1] Univ Bremen, Inst Comp Sci, D-28359 Bremen, Germany

来源：

2012 IEEE 15TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS) | 2012年

关键词：

DIAGNOSIS; LOCALIZATION; ARCHITECTURE; ACCURACY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Due to the increasing design size and complexity of modern Integrated Circuits (IC) and the decreasing time-to-market, debugging is one of the major bottlenecks in the IC development cycle. This paper presents a generalized approach to automate debugging which can be used in different scenarios from design debugging to post-silicon debugging. The approach is based on model-based diagnosis. Diagnostic traces are proposed as an enhancement reducing debugging time and increasing diagnosis accuracy. The experimental results show the effectiveness of the approach in post-silicon debugging.

引用

页码：324 / 329

页数：6

共 32 条

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