Degradation and Leakage Currents in AlQ3 and MEH-PPV based Organic Light Emitting Diodes

被引：0

作者：

Predeep, P. ^{[1
]}

Hameed, T. A. Shahul ^{[2
]}

Aneesh, J. ^{[1
]}

Baiju, M. R. ^{[3
]}

机构：

[1] Natl Inst Technol, Lab Unconvent Elect & Photon, Calicut 673603, Kerala, India

[2] TKM Coll Engn, Dept Elect & Commun, Kollam 691005, Kerala, India

[3] Coll Engn, Dept Elect & Commun, Trivandrum 695016, Kerala, India

来源：

OPTICS: PHENOMENA, MATERIALS, DEVICES, AND CHARACTERIZATION: OPTICS 2011: INTERNATIONAL CONFERENCE ON LIGHT | 2011年 / 1391卷

关键词：

OLED; PLED; AlQ3; MEH-PPVe;

D O I：

10.1063/1.3646818

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

From its very inception and development, degradation of Organic Light Emitting Diodes has been a problem before researchers. How the degradation affects the output current in small molecule based Organic Light Emitting Diodes and Polymer light Emitting Diodes is discussed. Non emissive dark spot leads to degradation was the initial understanding with respect to this phenomenon and later perimeter leakage current also assumed to contribute to this. Here the observations in the variations in leakage current and bulk resistance against operational hours are presented.

引用

页数：3

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