Variable aperture & dynamic scanning noise measurement system of photoelectric imaging device

被引:0
作者
Bai, LF [1 ]
Sun, SY [1 ]
Xu, R [1 ]
Zhang, BM [1 ]
机构
[1] Nanjing Univ Sci & Technol, Sch Elect Engn & Optoelect Technol, Nanjing 210094, Peoples R China
来源
PHOTONIC SYSTEMS AND APPLICATIONS | 2001年 / 4595卷
关键词
photoelectric imaging device; noise measurement; variable aperture; dynamic scanning; SNR;
D O I
10.1117/12.446618
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper, the measurement and analysis of the second-generation image intensifier have been discussed in detail. On the base of analyzing on the noise measurement principle of the second-generation image intensifier, the variable aperture & dynamic scanning noise measurement technique has been put forward. By using photoelectric multiply-tube which is low noise and high gain as the low light detector, the variable aperture & dynamic scanning noise measurement system of the second-generation image intensifier has been developed. The design and the schematic diagram of this noise measurement system have been present. Based on the above, the SNR has been tested and analyzed with variable incidence illumination, variable aperture in fixed-point measurement and scanning measurement condition. The corresponding noise distribution curves have been drawn. At last the characteristics of this noise measurement system of the second-generation image intensifier have been given out. This noise measurement system has important meaning on the design, evaluating and manufacturing of new photoelectric imaging device.
引用
收藏
页码:231 / 236
页数:6
相关论文
共 5 条
[1]  
ESCHARD G, 1976, ADV ELECTRON ELECT A, V40, P141
[2]  
FANG RZ, 1988, PHOTOELECTRIC DEVICE, P72
[3]  
HERTEL RJ, 1989, P SOC PHOTO-OPT INS, V1155, P332
[4]   EVALUATION OF IMAGE INTENSIFIERS [J].
POLLEHN, HK .
OPTICAL ENGINEERING, 1982, 21 (01) :34-37
[5]  
ZHANG BM, 1992, INTRO IMAGING SYSTEM, P172