Micro-benchmarking Flash Memory File-System Wear leveling and Garbage Collection : a Focus on Initial State Impact

被引:2
作者
Olivier, Pierre [1 ]
Boukhobza, Jalil [1 ]
Senn, Eric [1 ]
机构
[1] Univ Europeenne Bretagne, Bretagne, France
来源
15TH IEEE INTERNATIONAL CONFERENCE ON COMPUTATIONAL SCIENCE AND ENGINEERING (CSE 2012) / 10TH IEEE/IFIP INTERNATIONAL CONFERENCE ON EMBEDDED AND UBIQUITOUS COMPUTING (EUC 2012) | 2012年
关键词
component; NAND Flash memory; File System; Benchmarking; Wear leveling; Garbage Collection; Performance; Embedded Linux;
D O I
10.1109/ICCSE.2012.67
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
NAND flash memories are currently the de facto secondary storage technology in the embedded system domain thanks to their benefits mainly in terms of energy consumption, I/O performance, and data storage density. This Non-Volatile Memory (NVM) technology has even made substantial strides into enterprise storage systems. However, flash memories have particular constraints that are mainly the limited lifetime, the erase-before-write rule, and the write/erase operation granularity asymmetry. Those peculiarities are either handled in hardware, throughout a specific controller, or in software, with the help of a dedicated Flash File System (FFS). This paper presents a comprehensive study on the impact of different FFS implementations of wear leveling and garbage collection on flash memory performance and lifetime according to different initial states. This study is an attempt to push state-of-the-art work on FFSs by adding some flash memory specific features micro-benchmarking techniques.
引用
收藏
页码:437 / 444
页数:8
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