On the imaging mechanism of ferroelectric domains in scanning force microscopy

被引：11
|
作者：
Gruverman, A
Tokumoto, H
机构：
[1] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
[2] Natl Inst Adv Interdisciplinary Res, Joint Res Ctr Atom Technol, Tsukuba, Ibaraki 305, Japan
来源：
NANO LETTERS | 2001年 / 1卷 / 02期
关键词：
D O I：
10.1021/nl005522r
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Scanning force microscopy (SFM) studies of the domain structure in ferroelectric thin films on a nonmetal substrate allowed direct assessment of the electrostatic mechanism contribution to the domain contrast in the SFM contact mode. It has been shown that the polarization charges of the ferroelectric film are effectively compensated. This result suggests secondary effect of the electrostatic tip-sample interaction on domain imaging mechanism in ferroelectric thin films in contact SFM compared to the major contribution of the piezoelectric effect.
引用
收藏
页码：93 / 95
页数：3
相关论文
共 50 条
  • [1] Contrast mechanism for visualization of ferroelectric domains with scanning force microscopy
    Jungk, T.
    Soergel, E.
    FERROELECTRICS, 2006, 334 : 29 - 34
  • [2] Kinetics of ferroelectric domains investigated by scanning force microscopy
    Likodimos, V
    Labardi, M
    Allegrini, M
    PHYSICAL REVIEW B, 2000, 61 (21): : 14440 - 14447
  • [3] Ferroelectric domain imaging mechanism in high-vacuum scanning force microscopy
    Zeng, HR
    Yu, HF
    Chu, RQ
    Li, GR
    Yin, QR
    CHINESE PHYSICS LETTERS, 2005, 22 (01): : 43 - 45
  • [4] Contrast mechanism of ferroelectric domains in scanning capacitance microscopy
    Leu, CC
    Chien, CH
    Chen, CY
    Chang, MN
    Hsu, FY
    Hu, CT
    ELECTROCHEMICAL AND SOLID STATE LETTERS, 2004, 7 (10) : A327 - A330
  • [5] Scanning resistive probe microscopy: Imaging ferroelectric domains
    Park, H
    Jung, J
    Min, DK
    Kim, S
    Hong, S
    Shin, H
    APPLIED PHYSICS LETTERS, 2004, 84 (10) : 1734 - 1736
  • [6] Contrast mechanisms for the detection of ferroelectric domains with scanning force microscopy
    Jungk, Tobias
    Hoffmann, Akos
    Soergel, Elisabeth
    NEW JOURNAL OF PHYSICS, 2009, 11
  • [7] Scanning force microscopy: Application to nanoscale studies of ferroelectric domains
    Gruverman, A
    Auciello, O
    Tokumoto, H
    INTEGRATED FERROELECTRICS, 1998, 19 (1-4) : 49 - 83
  • [8] Ferroelectric domains and domain boundaries observed by scanning force microscopy
    Eng, LM
    Fousek, J
    Gunter, P
    FERROELECTRICS, 1997, 191 (1-4) : 419 - 426
  • [9] Imaging of ferroelectric domains by atomic force acoustic microscopy
    Rabe, U
    Amelio, S
    Hirsekorn, S
    Arnold, W
    ACOUSTICAL IMAGING, VOL 25, 2000, 25 : 253 - 260
  • [10] SCANNING FORCE MICROSCOPY AS A TOOL FOR NANOSCALE STUDY OF FERROELECTRIC DOMAINS
    Gruverman, Alexei
    Auciello, Orlando
    Hatano, Jun
    Tokumoto, Hiroshi
    FERROELECTRICS, 1996, 184 : 11 - 20
12345