Reflection Symmetry Detection via Appearance of Structure Descriptor

被引:17
作者
Atadjanov, Ibragim R. [1 ]
Lee, Seungkyu [1 ]
机构
[1] Kyung Hee Univ, Dept Comp Engn, Seoul, South Korea
来源
COMPUTER VISION - ECCV 2016, PT III | 2016年 / 9907卷
关键词
Symmetry detection; Structure; Feature; Reflection; SCALE; AXES;
D O I
10.1007/978-3-319-46487-9_1
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Symmetry in visual data represents repeated patterns or shapes that is easily found in natural and human-made objects. Symmetry pattern on an object works as a salient visual feature attracting human attention and letting the object to be easily recognized. Most existing symmetry detection methods are based on sparsely detected local features describing the appearance of their neighborhood, which have difficulty in capturing object structure mostly supported by edges and contours. In this work, we propose a new reflection symmetry detection method extracting robust 4-dimensional Appearance of Structure descriptors based on a set of outstanding neighbourhood edge segments in multiple scales. Our experimental evaluations on multiple public symmetry detection datasets show promising reflection symmetry detection results on challenging real world and synthetic images.
引用
收藏
页码:3 / 18
页数:16
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