Dimensional considerations in achieving large quality factors for resonant silicon cantilevers in air

被引:73
作者
Naeli, Kianoush [1 ]
Brand, Oliver [1 ]
机构
[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
基金
美国国家科学基金会;
关键词
FORCE MICROSCOPY CANTILEVERS; BEAM RESONATORS; FREQUENCY-RESPONSE; SENSORS; NOISE; OSCILLATORS; DISSIPATION; SENSITIVITY; DEPENDENCE; VIBRATIONS;
D O I
10.1063/1.3062204
中图分类号
O59 [应用物理学];
学科分类号
摘要
This work aims to provide guidelines for designing rectangular silicon cantilever beams to achieve maximum quality factors for the fundamental flexural resonance at atmospheric pressure. The methodology of this work is based on experimental data acquisition of resonance characteristics of silicon cantilevers, combined with modification of analytical damping models to match the captured data. For this purpose, rectangular silicon cantilever beams with thicknesses of 5, 7, 8, 11, and 17 mu m and lengths and widths ranging from 70 to 1050 mu m and 80 to 230 mu m, respectively, have been fabricated and tested. Combining the three dominant damping mechanisms, i.e., the air damping, support loss, and thermoelastic damping, the variation in the measured Q-factors with the cantilever geometrical dimensions is predicted. Also to better describe the experimental data, modified models for air damping have been developed. These modified models can predict the optimum length and thickness of a resonant cantilever to achieve the maximum quality factor at the fundamental flexural resonance mode in air. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3062204]
引用
收藏
页数:10
相关论文
共 46 条
[1]  
[Anonymous], 2004, FLUID MECH
[2]  
Baker WilfredE., 1967, International Journal of Mechanical Sciences, V9, P743, DOI [10.1016/0020-7403(67)90032-X, DOI 10.1016/0020-7403(67)90032-X]
[3]   DEPENDENCE OF THE QUALITY FACTOR OF MICROMACHINED SILICON BEAM RESONATORS ON PRESSURE AND GEOMETRY [J].
BLOM, FR ;
BOUWSTRA, S ;
ELWENSPOEK, M ;
FLUITMAN, JHJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (01) :19-26
[4]   Environmental sensors based on micromachined cantilevers with integrated read-out [J].
Boisen, A ;
Thaysen, J ;
Jensenius, H ;
Hansen, O .
ULTRAMICROSCOPY, 2000, 82 (1-4) :11-16
[5]  
Braginsky V. B., 1985, Systems With Small Dissipation
[6]   RESONANCE RESPONSE OF SCANNING FORCE MICROSCOPY CANTILEVERS [J].
CHEN, GY ;
WARMACK, RJ ;
THUNDAT, T ;
ALLISON, DP ;
HUANG, A .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (08) :2532-2537
[7]   Experimental validation of theoretical models for the frequency response of atomic force microscope cantilever beams immersed in fluids [J].
Chon, JWM ;
Mulvaney, P ;
Sader, JE .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (08) :3978-3988
[8]   Noise processes in nanomechanical resonators [J].
Cleland, AN ;
Roukes, ML .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (05) :2758-2769
[9]   A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY [J].
CLEVELAND, JP ;
MANNE, S ;
BOCEK, D ;
HANSMA, PK .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (02) :403-405
[10]   Elastic wave transmission at an abrupt junction in a thin plate with application to heat transport and vibrations in mesoscopic systems [J].
Cross, MC ;
Lifshitz, R .
PHYSICAL REVIEW B, 2001, 64 (08)