Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by a cavity resonance method

被引：0
|
作者：
Kobayashi, Y [1 ]
Shimizu, T [1 ]
机构：
[1] Saitama Univ, Dept Elect & Elect Syst, Urawa, Saitama 3388570, Japan
来源：
1999 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-4 | 1999年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A novel circular cavity resonance method based on a rigorous analysis by the mode matching technique is proposed to measure the temperature dependences of complex permittivity of low loss dielectric plates accurately in the millimeter wave range 30-100 GHz. The measured results for GaAs substrates verify the usefulness.
引用
收藏
页码：1885 / 1888
页数：4
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