Stability and Performance Analysis of Low Power 6T SRAM Cell and Memristor Based SRAM Cell using 45NM CMOS Technology

被引:0
|
作者
Kumar, A. S. V. S. V. Prabhu Deva [1 ]
Suman, B. Shaiwal [1 ]
Sarkar, C. Arup [1 ]
Kushwaha, D. Vivekanand [2 ]
机构
[1] ITM Univ, Gwalior, MP, India
[2] RGPV Bhopal, Bhopal, MP, India
关键词
6T SRAM; 4T SRAM; Memristor; Parameters; Implementation;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In recent years, there has been a growing demand for low-power devices, due to the fact that the expansion of CMOS technology. Scale, the crystal size corresponds to the SOC storage phenomenon, system-on-chip (SOC), decreased by the number of transistors increased. Overall, the number of transistors in the number of transistors on a chip of information is used for various functions. They need economic, low energy consumption to promote the design capacity to increase, low power consumption and little memory because it plays an important role for the growth of the overall energy consumption device design parameters playing tight leakage power devices. Although it can be used any bit of the flip-flop - hitting the SRAM-type semiconductor SRAM: this memory is turned off to the loss of data in the conventional sense. It is used to compare the results of the memristor SRAM and SRAM. The calculation is simple memristor SRAM and SRAM based on the design parameters in 45nm technology, the Cadence tool.
引用
收藏
页码:2218 / 2222
页数:5
相关论文
共 50 条
  • [41] Simulations on 130 nm Technology 6T SRAM Cell for Near-Threshold Operation
    Kutila, Mika
    Paasio, Ari
    Lehtonen, Teijo
    2014 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2014, : 1211 - 1214
  • [42] A low power, high speed FinFET based 6T SRAM cell with enhanced write ability and read stability
    Premavathi, Rahaprian Mudiarasan
    Tong, Qiang
    Choi, Ken
    Lee, Yunsik
    2016 INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC), 2016, : 311 - 312
  • [43] 45nm low-power CMOS SoC technology with aggressive reduction of random variation for SRAM and analog transistors
    Ekbote, S.
    Benaissa, K.
    Obradovic, B.
    Liu, S.
    Shichijo, H.
    Hou, F.
    Blythe, T.
    Houston, T. W.
    Martin, S.
    Taylor, R.
    Singh, A.
    Yang, R.
    Baldwin, G.
    2008 SYMPOSIUM ON VLSI TECHNOLOGY, 2008, : 125 - 126
  • [44] Ultra Low Power 6T SRAM Cell Designed On 65nm Low Power Technology Platform Suitable For High Temperature Applications
    Liu, Jinhua
    Zhou, June
    Zhou, Allan
    Chen, JinMing
    Huang, Stella
    Ning, Jay
    Yu, ShaoFeng
    CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2013 (CSTIC 2013), 2013, 52 (01): : 99 - 103
  • [45] Static Noise Margin Analysis of 6T SRAM Cell
    Jose, Abinkant A.
    Balan, Nikhitha C.
    ARTIFICIAL INTELLIGENCE AND EVOLUTIONARY COMPUTATIONS IN ENGINEERING SYSTEMS, ICAIECES 2015, 2016, 394 : 249 - 258
  • [46] Design and Analysis of 8T SRAM with Assist Schemes (UDVS) In 45nm CMOS
    Chokkakula, Ganesh
    Reddy, Satish N.
    Devendra, Bhumarapu
    Kumar, Satheesh S.
    PROCEEDINGS OF 2017 IEEE INTERNATIONAL CONFERENCE ON CIRCUIT ,POWER AND COMPUTING TECHNOLOGIES (ICCPCT), 2017,
  • [47] Design and Analysis of a Noise Induced 6T SRAM Cell
    Rizvi, Isma
    Nidhi
    Mishra, Rajesh
    Hashmi, M. S.
    2016 INTERNATIONAL CONFERENCE ON ELECTRICAL, ELECTRONICS, AND OPTIMIZATION TECHNIQUES (ICEEOT), 2016, : 4209 - 4213
  • [48] In 12nm FinFET Technology, performance analysis of low power 6T SRAM layout designs with two different topologies
    Barua, Sajib
    Irin, Umme Hani
    Azmir, Md Minhajul
    Bappy, Md Maruf Abir
    Alam, Shayadul
    2022 IEEE MICROELECTRONICS DESIGN & TEST SYMPOSIUM (MDTS), 2022,
  • [49] Comparison on 6T, 5T and 4T SRAM Cell using 22nm technology
    Rohini, R.
    Sampson, Jenyfal
    Sivakumar, P.
    2017 IEEE INTERNATIONAL CONFERENCE ON ELECTRICAL, INSTRUMENTATION AND COMMUNICATION ENGINEERING (ICEICE), 2017,
  • [50] 45nm node planar-SOI technology with 0.296μm2 6T-SRAM cell
    Yang, FL
    Huang, CC
    Huang, CC
    Chung, TX
    Chen, HY
    Chang, CY
    Chen, HW
    Lee, DH
    Liu, SD
    Chen, KH
    Wen, CK
    Cheng, SM
    Yang, CT
    Kung, LW
    Lee, CL
    Chou, YJ
    Liang, FJ
    Shiu, LH
    You, JW
    Shu, KC
    Chang, BC
    Shin, JJ
    Chen, CK
    Gau, TS
    Wang, PW
    Chan, BW
    Hsu, PF
    Shieh, JH
    Fung, SKH
    Diaz, CH
    Wu, CMM
    See, YC
    Lin, BJ
    Liang, MS
    Sun, JYC
    Hu, CM
    2004 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2004, : 8 - 9