Suspended Nanoscale Field Emitter Devices for High-Temperature Operation

被引:15
|
作者
De Rose, Lucia B. [1 ]
Scherer, Axel [1 ]
Jones, William M. [2 ]
机构
[1] CALTECH, Dept Appl Phys, Pasadena, CA 91125 USA
[2] CALTECH, Jet Prop Lab, Pasadena, CA 91125 USA
关键词
Electron emission; Fowler-Nordheim field emission; Frenkel-Poole emission; high-temperature; leakage current; metallic emitter; vacuum microelectronics; ELECTRON-EMISSION; ARRAYS;
D O I
10.1109/TED.2020.3019765
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, we demonstrate suspended two- and four-terminal field emission devices for high-temperature operation. The planar structures were fabricated with tungsten on a 200-nm silicon nitride membrane. The insulator in the vicinity of the terminals was removed to minimize undesirable Frenkel-Poole emission and increase the resistance of leakage current pathways. The effects of temperatures up to 450 degrees C on Fowler-Nordheim emission characteristics and parasitic leakage resistance were studied. Turn-on voltages with magnitudes under 15 V that further decreased as a function of increasing temperature for the two-terminal device were reported. Gating at temperatures of 150 degrees C and 300 degrees C was shown for the fourterminal device, and corresponding transconductance and cutoff frequency values were computed.
引用
收藏
页码:5125 / 5131
页数:7
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