A time resolved high energy X-ray diffraction study of cooling liquid SiO2

被引：0

作者：

Skinner, L. B. ^{[1
,2
]}

Benmore, C. J. ^{[1
]}

Weber, J. K. R. ^{[1
,3
]}

Wilding, M. C. ^{[4
]}

Tumber, S. K. ^{[3
]}

Parise, J. B. ^{[2
,5
,6
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Xray Sci Div, Argonne, IL 60439 USA

[2] SUNY Stony Brook, Inst Mineral Phys, Stony Brook, NY 11794 USA

[3] Mat Dev Inc, Arlington Hts, IL 60004 USA

[4] Univ Wales, Inst Math & Phys Sci, Aberystwyth SY23 3BZ, Cerdigion, Wales

[5] SUNY Stony Brook, Dept Geosci, New York, NY 11794 USA

[6] Brookhaven Natl Lab, Photon Sci Div, Upton, NY 11973 USA

来源：

PHYSICAL CHEMISTRY CHEMICAL PHYSICS | 2013年 / 15卷 / 22期

关键词：

SCATTERING FACTORS; SILICA; NEUTRON; GLASS;

D O I：

10.1039/c3cp44347g

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The evolution of the X-ray structure factor and corresponding pair distribution function of SiO2 has been measured upon cooling from the melt using high energy X-ray diffraction combined with aerodynamic levitation. Small changes in the position of the average Si-O bond distance and peak width are found to occur at similar to 1500(100) K in the region of the calorimetric glass transition temperature, T-g and the observed density minima. At higher temperatures deviations from linear behavior are seen in the first sharp diffraction peak width, height and area at around 1750(50) K, which coincides with the reported density maximum around 1.2T(g).

引用

页码：8566 / 8572

页数：7

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