Epoxy-functionalized surfaces for microarray applications: surface chemical analysis and fluorescence labeling of surface species

被引：23

作者：

Funk, Christian ^{[2
]}

Dietrich, Paul M. ^{[1
]}

Gross, Thomas ^{[1
]}

Min, Hyegeun ^{[1
]}

Unger, Wolfgang E. S. ^{[1
]}

Weigel, Wilfried ^{[2
,3
]}

机构：

[1] BAM Fed Inst Mat Res & Testing, Surface & Thin Film Anal WG, D-12203 Berlin, Germany

[2] Humboldt Univ, Inst Chem, D-12489 Berlin, Germany

[3] Scien AG, D-12489 Berlin, Germany

来源：

SURFACE AND INTERFACE ANALYSIS | 2012年 / 44卷 / 08期

关键词：

epoxy silane; microarrays; fluorescence; XPS; ToF-SIMS; surface analysis;

D O I：

10.1002/sia.3856

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Methods for characterization of epoxy-functionalized substrates used for microarray applications, prepared by silanization with 3-glycidoxypropyltrimethoxysilane, have been developed. Contact angle measurements, X-ray photoelectron spectroscopy, time of flight secondary ion mass spectrometry and fluorescence based methods have been applied to investigate these epoxy-functionalized microarray substrates. The surface density of epoxy-functionalized glass slides was investigated by fluorescence labeling of surface species utilizing Rhodamine 110 as fluorescence probe. Copyright (c) 2011 John Wiley & Sons, Ltd.

引用

页码：890 / 894

页数：5

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