Stigmatic X-ray imaging using a single spherical Laue crystal

被引:1
作者
del Rio, M. Sanchez [1 ]
Bianchi, D. [2 ]
Pikuz, T. A. [4 ]
Faenov, A. Ya [3 ,4 ]
Pikuz, S. A., Jr. [4 ]
Delgado-Aparicio, L. [5 ]
Pablant, N. [5 ]
Bitter, M. [5 ]
Hill, K. [5 ]
机构
[1] European Synchrotron Radiat Facil, BP 220, F-38043 Grenoble, France
[2] Vienna Univ Technol, A-1040 Vienna, Austria
[3] Japan Atom Energy Agcy, Quantum Beam Sci Directorate, Kyoto, Kizugawa 6190215, Japan
[4] Russian Acad Sci, Joint Inst High Temp, Moscow 125412, Russia
[5] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA
来源
11TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI 2012) | 2013年 / 425卷
关键词
OPTICS;
D O I
10.1088/1742-6596/425/19/192021
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We propose a crystal configuration using a single Laue spherical crystal for imaging applications. A crystal in Laue geometry set to focus a divergent beam in the meridional (diffraction) plane, but does not focus in the sagittal plane. A transmission object placed in the beam is imaged with different horizontal and vertical aspect ratio, but it is possible to find a configuration with similar aspect ratio. This system is studied using ray tracing, which permit to reproduce preliminary experimental data [1]. The concept of a stigmatic focusing by a single optical element may have applications in imaging, like in transmission microscopy or for hard X-ray backlighting and self-imaging in high energy density plasma experiments. Inertial confinement fusion experiments and large tokamak projects such as ITER may benefit from this optical configuration.
引用
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页数:4
相关论文
共 5 条
[1]   THE LENS EQUATION FOR BRAGG-DIFFRACTION OPTICS - THE GENERAL-CASE OF ASYMMETRICAL REFLECTION [J].
CHUKHOVSKII, FN ;
KRISCH, M .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 :211-213
[2]   SHADOW3: a new version of the synchrotron X-ray optics modelling package [J].
del Rio, Manuel Sanchez ;
Canestrari, Niccolo ;
Jiang, Fan ;
Cerrina, Franco .
JOURNAL OF SYNCHROTRON RADIATION, 2011, 18 :708-716
[3]   A novel imaging x-ray microscope based on a spherical crystal [J].
del Rio, MS ;
Alianelli, L ;
Pikuz, TA ;
Faenov, AY .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (08) :3291-3303
[4]   Hard x-ray imaging using free-standing spherically bent crystals [J].
Faenov, AY ;
Pikuz, TA ;
Avrutin, V ;
Izyumskaya, N ;
Shabelnikov, L ;
Shulakov, E ;
Kyrala, GA .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (03) :2224-2227
[5]  
Sanchez del Rio M., 1998, SPIE P, V3448, P230