Speedy flash-based FPGAs score with 500-kgate density

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Bursky, D
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TM [电工技术]; TN [电子技术、通信技术];
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页码:35 / +
页数:4
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[41]   Experimental study on heavy ion single-event effects in flash-based FPGAs (vol 27, 7, 2016) [J].
Yang, Zhen-Lei ;
Wang, Xiao-Hui ;
Su, Hong ;
Liu, Jie ;
Liu, Tian-Qi ;
Xi, Kai ;
Wang, Bin ;
Gu, Song ;
She, Qian-Shun .
NUCLEAR SCIENCE AND TECHNIQUES, 2016, 27 (03)
[42]   A Novel Propagation Model for Heavy-Ions Induced Single Event Transients on 65nm Flash-based FPGAs [J].
Du, B. ;
Colucci, M. ;
Francola, S. ;
Aranci, L. ;
Artina, E. ;
Ratti, N. ;
Picardi, E. ;
Mancini, R. ;
Piloni, V. ;
Azimi, S. ;
Sterpone, L. .
2020 20TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS 2020), 2022, :63-66
[43]   CPF: A Cross-Layer Prefetching Framework for High-Density Flash-based Storage [J].
Luo, Longfei ;
Wang, Han ;
Yu, Dingcui ;
Lv, Yina ;
Shi, Liang .
2024 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATE, 2024,
[44]   Single Event Latch-Up Hardening Using TCAD Simulations in 130 nm and 65 nm Embedded SRAM in Flash-Based FPGAs [J].
Rezzak, Nadia ;
Wang, Jih-Jong .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 62 (04) :1599-1608
[45]   Utilization of Unsigned Inputs for NAND Flash-Based Parallel and High-Density Synaptic Architecture in Binary Neural Networks [J].
Lee, Sung-Tae ;
Yeom, Gyuho ;
Hwang, Joon ;
Kim, Hyeongsu ;
Yoo, Honam ;
Park, Byung-Gook ;
Lee, Jong-Ho .
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2021, 9 :1049-1054
[46]   Straw: A Stress-Aware WL-Based Read Reclaim Technique for High-Density NAND Flash-Based SSDs [J].
Chun, Myoungjun ;
Lee, Jaeyong ;
Choi, Inhyuk ;
Park, Jisung ;
Kim, Myungsuk ;
Kim, Jihong .
IEEE COMPUTER ARCHITECTURE LETTERS, 2025, 24 (01) :5-8
[47]   A Novel Array Programming Scheme for Large Matrix Processing in Flash-Based Computing-in-Memory (CIM) With Ultrahigh Bit Density [J].
Feng, Yang ;
Zhang, Dong ;
Zhao, Guoqing ;
Sun, Zhaohui ;
Bai, Maoying ;
Qi, Yueran ;
Gong, Xiao ;
Liu, Jing ;
Zhang, Junyu ;
Wu, Jixuan ;
Zhan, Xuepeng ;
Chen, Jiezhi .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 70 (02) :461-467