Surface modification of polyimide with excimer UV radiation at wavelength of 126 nm

被引:17
作者
Chen, W [1 ]
Zhang, JY
Fang, Q
Hu, KL
Boyd, IW
机构
[1] Chinese Acad Sci, Univ Sci & Technol China, Struct Res Lab, Hefei 230026, Anhui, Peoples R China
[2] Chinese Acad Sci, Inst Solid State Phys, Hefei 230031, Peoples R China
[3] UCL, London WC1E 7JE, England
关键词
excimer; UV radiation; surface modification; polymer;
D O I
10.1016/j.tsf.2003.11.153
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report the achievement of large area surface modification of polyimide (PI) films by using an excimer lamp at 126 nm. Analysis of the morphology changes and composition of the polymer surface was carried out via SEM, AFM and XPS techniques. SEM and AFM results show that the roughness of the polymer surface increases drastically after a very short UV exposure time, and the morphology change produced by the 126 nm UV lamp is much larger and more efficient than that by 172 nm UV radiation. XPS results suggest that photo-dissociation of imide groups in PI occurs during the 126 nm UV radiation. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:3 / 6
页数:4
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