Development of a three-dimensional vibrating tactile probe for miniature CMMs

被引:65
作者
Claverley, James D. [1 ]
Leach, Richard K. [1 ]
机构
[1] Natl Phys Lab, Engn Measurement Div, Teddington TW11 0LW, Middx, England
来源
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 2013年 / 37卷 / 02期
基金
英国工程与自然科学研究理事会;
关键词
Miniature CMM probe; Vibrating; 3D; Isotropic; Micro CMM; MICRO; TECHNOLOGY;
D O I
10.1016/j.precisioneng.2012.12.008
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents the development and characterisation of a vibrating tactile probe for miniature coordinate measuring machines. Current probing technology is limited by several factors including the reduced size of the parts to be measured, the use of novel and delicate materials for manufacturing and the need for lower uncertainties of measurement, The solution developed at the National Physical Laboratory (NPL) is a novel, silicon-free triskelion (three-legged) MEMS flexure structure assembled with a sphere-tipped micro-stylus. The mechanical design and modelling of the probe are reported along with a description of the manufacturing routes, assembly solutions developed, operation and metrological characterisation methods. Results from the experimental testing demonstrate that the probe is not affected by snap-in when probing in vertical and lateral directions. Preliminary results from experimental testing also demonstrate that the probe is capable of detecting the effect of the surface interaction forces within 150 nm of the physical surface, suggesting that the probe is capable of operating in a non-contact mode. The performance of the probe has been tested in both the vertical and lateral directions. Crown Copyright (C) 2013 Published by Elsevier Inc. All rights reserved.
引用
收藏
页码:491 / 499
页数:9
相关论文
共 37 条
[1]  
Andersson KM, 2004, THESIS ROYAL I TECHN
[2]  
[Anonymous], 2010, 1036052010 ISO
[3]  
[Anonymous], 1996, CIRP ANN, DOI DOI 10.1016/S0007-8506(07)63107-2
[4]  
Bauza MB, 2005, REV SCI INSTRUM, V76, P95
[5]  
Bono M, 2006, UCRLJRNL225803 LAWR
[6]   Aspects of tactile probing on the micro scale [J].
Bos, E. J. C. .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2011, 35 (02) :228-240
[7]  
Burisch A, 2004, MECHATRONICS ROBOTIC, V4, P1370
[8]  
Burisch A, 2010, IFIP ADV INF COMM TE, V315, P227
[9]  
Claverley JD, 2010, IFIP ADV INF COMM TE, V315, P131
[10]   A vibrating micro-scale CMM probe for measuring high aspect ratio structures [J].
Claverley, James D. ;
Leach, Richard K. .
MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2010, 16 (8-9) :1507-1512