Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter

被引：11

作者：

Ren, Y. ^{[1
]}

Fan, L. ^{[1
]}

Chen, L. ^{[1
]}

Wen, S. -J. ^{[2
]}

Wong, R. ^{[2
]}

van Vonno, N. W. ^{[3
]}

Witulski, A. F. ^{[4
]}

Bhuva, B. L. ^{[4
]}

机构：

[1] Univ Saskatchewan, Saskatoon, SK, Canada

[2] Cisco Syst Inc, San Jose, CA USA

[3] Intersil Inc, Milpitas, CA USA

[4] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN USA

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2012年 / 28卷 / 06期

基金：

加拿大自然科学与工程研究理事会;

关键词：

Single-event transient; Pulse width modulator; DC/DC converter; Laser;

D O I：

10.1007/s10836-012-5338-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Alpha particles, neutrons and laser-beam test results on an integrated pulse width modulation (PWM) controller operating in a DC/DC converter are presented in this paper. The PWM is fabricated on a 600-nm Bi-CMOS technology. Single-Event Transient (SET) derived from a bandgap circuit was amplified by a filter capacitor in the propagation path. Finally, a constant 6-mu s SET pulse was observed on PGOOD pin which is a supervisory signal. This glitch caused system resets. Pulsed laser technology was adopted to locate the origin of the SET. 3D TCAD and circuit simulation tools were used to analyze the root cause. System and circuit level hardening approaches to mitigate the SET are also presented.

引用

页码：877 / 883

页数：7

共 14 条

[1] Digital Control for Radiation-Hardened Switching Converters in Space [J].