Thermally evaporated AgyCu2-ySnSe3 metal chalcogenide thin films and its characterization

被引：2
|
作者：
Helan, P. Prathiba Jeya [1 ]
Mohanraj, K. [1 ]
Sivakumar, G. [2 ]
机构：
[1] Manonmaniam Sundaranar Univ, Dept Phys, Tirunelveli 627012, Tamil Nadu, India
[2] Annamalai Univ, Dept Phys, CISL, Annamalainagar 608002, Tamil Nadu, India
来源：
OPTICAL MATERIALS | 2016年 / 62卷
关键词：
AgyCu2-ySnSe3 thin films; Peak shift; Different morphologies; High optical absorption; Low resistivity; AG; RB;
D O I：
10.1016/j.optmat.2016.10.038
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
AgyCu2-ySnSe3 thin films were prepared for four different Ag/Cu + Ag ratios (12.5%, 25%, 37.5% and 50%) by thermal vacuum evaporation technique. The XRD and HRTEM analysis assured the incorporation of Ag within the system. EDAX analysis confirmed the stoichiometric ratio of the compound. All the Ag incorporated thin films showed higher optical absorption than the Cu2SnSe3 thin film and their band gap values were found in the range of 1.93-1.63eV. The resistivity of AgyCu2-ySnSe3 thin films is much lesser than other silver based quaternary compounds such as CuAgGeSe3 and Cu0.5Ag0.5InSe2. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码：403 / 410
页数：8
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