(Naxk1-x)2Ta4O11 (x ≈ 0.93) piezoelectric phase from the transformation of Ta2O5 thin films of monoclinic structure

被引:2
作者
Le Gallic, M. [1 ]
Roussel, H. [1 ]
机构
[1] Minatec INP Grenoble, CNRS, UMR 5628, Mat & Genie Phys Lab, F-38016 Grenoble 1, France
关键词
Tantalum oxide; Natrotantite based compound; Ceramic thin film; Phase transformation; Transmission electron microscopy; Proton conduction; TANTALUM OXIDE; SYSTEMATICS; DEPOSITION; TA74W6O203; TA22W4O67; PROPERTY;
D O I
10.1016/j.jssc.2013.01.018
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
A phase of trigonal structure has been reported in previous articles to be piezoelectric with a very high longitudinal d(33) coefficient of several thousand pm/V U. Solid State Chem. 184 (2011) 2023, 2033). It was observed in Ta2O5 thin films and assumed to be the result of a reversible monoclinic-trigonal phase transition. However, new investigations are reported because the cell parameters of this phase are actually very close to those of the natrotantite mineral Na2Ta4O11. From analyses by X-ray energy dispersive spectroscopy (XEDS), the chemical composition of this trigonal phase corresponds to (NaxK1-x)(2)Ta4O11 with x approximate to 0.93. The origin of sodium, potassium, iron and oxygen atoms is found to be due to a pollution coming from alumina crucibles used for thermal treatments. Knowing both atomic structures Ta2O5 and Na2Ta4O11 and their structural relationships, observed by high resolution transmission electron microscopy (HRTEM), the mechanism of the reaction of transformation is re-examined and discussed. This mechanism implies that Ta5+ vacancies likely exist in monoclinic structures of tantalum oxide and that electrical neutrality could be due to incorporated proton H+ instead of O2- vacancies or Ta5+ interstitials. (C) 2013 Elsevier Inc. All rights reserved.
引用
收藏
页码:143 / 149
页数:7
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