Features for Texture Analysis

被引：0
作者：
Hossain, Shahera [1 ]
Serikawa, Seiichi [1 ]
机构：
[1] Kyushu Inst Technol, Dept Elect & Elect Engn, Kitakyushu, Fukuoka 804, Japan
来源：
2012 PROCEEDINGS OF SICE ANNUAL CONFERENCE (SICE) | 2012年
关键词：
Texture; feature; GLCM; Wavelet; random field; DEFECT DETECTION; INSPECTION; CLASSIFICATION;
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
In the field of computer vision and image processing, analysis and classification of texture images have various crucial applications. However, a detailed survey on how to extract and from which method features can be extracted is necessary. In this paper, we survey key approaches of features for texture analysis. We hope that this paper will be useful for a reader who has interest texture analysis.
引用
收藏
页码：1739 / 1744
页数：6
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