Generation of Uniform X-ray Illumination and Its Application to X-ray Diffraction Microscopy

被引:0
作者
Kunio, Katarzyna [1 ]
Espinoza, Shirly [2 ]
Khakurel, Krishna P. [2 ]
机构
[1] Wroclaw Univ Sci & Technol, Fac Elect Photon & Microsyst, Wybrzeze Stanislawa Wyspianskiego 27, PL-50370 Wroclaw, Poland
[2] Acad Sci Czech Republ, Inst Phys, ELI Beamlines, Na Slovance 1999-2, Prague 18221, Czech Republic
关键词
X-ray microscopy; flat-top X-ray beams; X-ray free-electron lasers; CONDENSER; OBJECT;
D O I
10.3390/photonics9120934
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
X-ray diffraction microscopy (XDM) is an established lens-less imaging method extensively practiced at synchrotrons and X-ray free-electron lasers (XFELs). XDM is broadly operated in two different modes: scanning and non-scanning. The non-scanning mode of operation in XDM is commonly called coherent diffraction imaging (CDI) and has been the key research direction of many XFEL facilities. This method typically images objects smaller than the size of the illumination, which precludes the imaging of a large group of samples physically larger than the illumination. Furthermore, satisfying this requirement at X-ray free-electron lasers tremendously reduces the volume of practically useful data, leading the experimental scheme to be less efficient. Such a limitation can be circumvented by using a uniform illumination probe rather than the traditional Gaussian-focused probe from the X-ray focusing optics. Here in this article, we report a numerical study on the design of an optical element to generate uniform X-ray illumination and its application to the CDI. We demonstrate the benefits of such illumination in imaging objects that are larger than the illumination size and in improving the efficiency of the experimental scheme overall.
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页数:10
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共 31 条
[1]   Keyhole coherent diffractive imaging [J].
Abbey, Brian ;
Nugent, Keith A. ;
Williams, Garth J. ;
Clark, Jesse N. ;
Peele, Andrew G. ;
Pfeifer, Mark A. ;
De Jonge, Martin ;
McNulty, Ian .
NATURE PHYSICS, 2008, 4 (05) :394-398
[2]   Quantitative and correlative extreme ultraviolet coherent imaging of mouse hippocampal neurons at high resolution [J].
Baksh, Peter D. ;
Odstrcil, Michal ;
Miszczak, Magdalena ;
Pooley, Charles ;
Chapman, Richard Thomas ;
Wyatt, Adam Stacey ;
Springate, Emma ;
Chad, John ;
Deinhardt, Katrin ;
Frey, Jeremy Graham ;
Brocklesby, William S. .
SCIENCE ADVANCES, 2020, 6 (18)
[3]   Temporal and spectral multiplexing for EUV multibeam ptychography with a high harmonic light source [J].
Brooks, Nathan J. ;
Bin Wang ;
Binnie, Iona ;
Tanksalvala, Michael ;
Esashi, Yuka ;
Knobloch, Joshua L. ;
Nguyen, Quynh L. D. ;
McBennett, Brendan ;
Jenkins, Nicholas W. ;
Gui, Guan ;
Zhang, Zhe ;
Kapteyn, Henry C. ;
Murnane, Margaret M. ;
Bevis, Charles S. .
OPTICS EXPRESS, 2022, 30 (17) :30331-30346
[4]   Three-Dimensional Reconstruction of the Giant Mimivirus Particle with an X-Ray Free-Electron Laser [J].
Ekeberg, Tomas E ;
Svenda, Martin ;
Abergel, Chantal ;
Maia, Filipe R. N. C. ;
Seltzer, Virginie ;
Claverie, Jean-Michel ;
Hantke, Max ;
Joensson, Olof ;
Nettelblad, Carl ;
van der Schot, Gijs ;
Liang, Mengning ;
DePonte, Daniel P. ;
Barty, Anton ;
Seibert, M. Marvin ;
Iwan, Bianca ;
Andersson, Inger ;
Loh, N. Duane ;
Martin, Andrew V. ;
Chapman, Henry ;
Bostedt, Christoph ;
Bozek, John D. ;
Ferguson, Ken R. ;
Krzywinski, Jacek ;
Epp, Sascha W. ;
Rolles, Daniel ;
Rudenko, Artem ;
Hartmann, Robert ;
Kimmel, Nils ;
Hajdu, Janos .
PHYSICAL REVIEW LETTERS, 2015, 114 (09)
[5]   Material-specific high-resolution table-top extreme ultraviolet microscopy [J].
Eschen, Wilhelm ;
Loetgering, Lars ;
Schuster, Vittoria ;
Klas, Robert ;
Kirsche, Alexander ;
Berthold, Lutz ;
Steinert, Michael ;
Pertsch, Thomas ;
Gross, Herbert ;
Krause, Michael ;
Limpert, Jens ;
Rothhardt, Jan .
LIGHT-SCIENCE & APPLICATIONS, 2022, 11 (01)
[6]   RECONSTRUCTION OF AN OBJECT FROM MODULUS OF ITS FOURIER-TRANSFORM [J].
FIENUP, JR .
OPTICS LETTERS, 1978, 3 (01) :27-29
[7]   PHASE RETRIEVAL ALGORITHMS - A COMPARISON [J].
FIENUP, JR .
APPLIED OPTICS, 1982, 21 (15) :2758-2769
[8]   Beam-shaping condenser lenses for full-field transmission X-ray microscopy [J].
Jefimovs, Konstantins ;
Vila-Comamala, Joan ;
Stampanoni, Marco ;
Kaulich, Burkhard ;
David, Christian .
JOURNAL OF SYNCHROTRON RADIATION, 2008, 15 (106-108) :106-108
[9]   Generation of apodized X-ray illumination and its application to scanning and diffraction microscopy [J].
Khakurel, Krishna P. ;
Kimura, Takashi ;
Nakamori, Hiroki ;
Goto, Takumi ;
Matsuyama, Satoshi ;
Sasaki, Tomoya ;
Takei, Masashi ;
Kohmura, Yoshiki ;
Ishikawa, Tetsuya ;
Yamauchi, Kazuto ;
Nishino, Yoshinori .
JOURNAL OF SYNCHROTRON RADIATION, 2017, 24 :142-149
[10]   Coherent diffraction imaging of non-isolated object with apodized illumination [J].
Khakurel, Krishna P. ;
Kimura, Takashi ;
Joti, Yasumasa ;
Matsuyama, Satoshi ;
Yamauchi, Kazuto ;
Nishino, Yoshinori .
OPTICS EXPRESS, 2015, 23 (22) :28182-28190