Preparation and characterization of La1.8Sr0.2CuO4/La1.9Sr0.1CuO4 superconducting bilayers

被引：0

作者：

Zhang, Y. ^{[1
]}

An, Y. H. ^{[1
]}

Xing, Y. ^{[1
]}

Dong, D. Y. ^{[1
]}

Wang, S. L. ^{[1
]}

Shen, J. Q. ^{[1
]}

Li, P. G. ^{[1
]}

Tang, W. H. ^{[2
]}

机构：

[1] Zhejiang Sci Tech Univ, Ctr Optoelect Mat & Devices, Dept Phys, Hangzhou 310018, Zhejiang, Peoples R China

[2] Beijing Univ Posts & Telecommun, State Key Lab Informat Photon & Opt Commun, Sch Sci, Beijing 100876, Peoples R China

来源：

POWDER DIFFRACTION | 2013年 / 28卷

基金：

中国国家自然科学基金;

关键词：

La2-xSrxCuO4 thin film; pulsed laser deposition; superconducting bilayers; rectifying property; DEPOSITION;

D O I：

10.1017/S0885715612001017

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The c-oriented La1.8Sr0.2CuO4 and La1.9Sr0.1CuO4 bilayer films were deposited on (001) SrTiO3 single-crystal substrates by using the pulsed laser deposition technique. The effects of deposition parameters on the quality of thin films were investigated. The crystal structures and surface morphologies were characterized by means of XRD and SEM, and the results showed that an as-prepared film deposited with the optimized parameters has high quality. Then La1.8Sr0.2CuO4/La1.9Sr0.1CuO4 bilayers structure was prepared using the optimized parameters for each corresponding layer, and the electrical transport properties were measured. Interesting rectifying properties were observed at both room and low temperatures, and the rectifying ratio at low temperature was found to be much higher than that at room temperature. (C) 2013 International Centre for Diffraction Data.

引用

页码：S7 / S11

页数：5

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