Measurement of Channel Temperature in Ga2O3 MOSFETs

被引：0
|
作者：
Wong, Man Hoi [1 ]
Morikawa, Yoji [2 ]
Sasaki, Kohei [1 ,3 ]
Kuramata, Akito [3 ]
Yamakoshi, Shigenobu [3 ]
Higashiwaki, Masataka [1 ]
机构：
[1] Natl Inst Informat & Commun Technol, Tokyo, Japan
[2] Silvaco Japan Co Ltd, Yokohama, Kanagawa, Japan
[3] Tamura Corp, Tokyo, Japan
来源：
2016 COMPOUND SEMICONDUCTOR WEEK (CSW) INCLUDES 28TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE & RELATED MATERIALS (IPRM) & 43RD INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (ISCS) | 2016年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页数：1
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