Self-referenced electrical method for measuring frequency response of high-speed Mach-Zehnder modulators based on two-tone modulation

被引：1
作者：
Wang, Heng [1 ]
Zhang, Shangjian [1 ]
Zou, Xinhai [1 ]
Zhang, Yali [1 ]
Liu, Yong [1 ]
机构：
[1] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Sch Optoelect Informat, Chengdu 610054, Peoples R China
来源：
SEMICONDUCTOR LASERS AND APPLICATIONS VII | 2016年 / 10017卷
关键词：
Frequency response; Mach-Zehnder modulator; integrated optics devices; microwave photonics; CHIRP PARAMETERS; BAND;
D O I：
10.1117/12.2247663
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We demonstrated a self-referenced electrical method for measuring frequency response of high-speed Mach-Zehnder modulators (MZMs) based on two-tone modulation. The modulation index and half-wave voltage can be extracted from the heterodyne ratio of two desired components by properly adjusting bias voltage. The method achieves the electrical domain measurement of the frequency-dependent modulation indices and frequency-dependent half-wave voltages of MZMs without any extra calibration for the responsivity fluctuation in the photodetection. Moreover, it reduces half bandwidth requirements of photodetector and electrical spectrum analyzer by carefully choosing a half frequency relationship of two-tone microwave signals. The consistency between our method and the optical spectrum analysis method verifies the simple but accurate measurement.
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页数：6
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