Effects of Ultraviolet Irradiation and Atomic Oxygen Erosion on Total Electron Emission Yield of Polyimide

被引：18

作者：

Wu, Jiang ^{[1
]}

Miyahara, Akira ^{[2
]}

Khan, Arifur R. ^{[2
]}

Iwata, Minoru ^{[2
]}

Toyoda, Kazuhiro ^{[2
]}

Cho, Mengu ^{[2
]}

Zheng, Xiao Quan ^{[1
]}

机构：

[1] Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China

[2] Kyushu Inst Technol, Lab Spacecraft Environm Interact Engn, Kitakyushu, Fukuoka 8048550, Japan

来源：

IEEE TRANSACTIONS ON PLASMA SCIENCE | 2014年 / 42卷 / 01期

关键词：

Atomic oxygen (AO) erosion; polyimide (PI) film; total electron emission yield (TEEY); ultraviolet (UV) radiation effect;

D O I：

10.1109/TPS.2013.2288699

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Polymers used on low earth orbit (LEO) spacecraft surface suffer from an ultraviolet (UV) irradiation and orbital atomic oxygen (AO) erosion. These degradations may change the total electron emission yield (TEEY) of the materials and ultimately result in unexpected surface charging. In this paper, we chose polyimide (PI) film, a thermal control material, and carried out two types of ground-based degradation. The degradation methods were UV irradiation with five different equivalent solar hours, and AO erosion with two fluences equivalent to 0.5 and 1 year LEO flight time, respectively. Using an Auger microscope-based TEEY measurement system with a scanning measuring method, the TEEY of virgin and degraded PI films were tested and analyzed comparatively. The X-ray photoelectron spectrum, field-emission scanning electron microscope, and computational simulations were also used for element bonds analysis, roughness imaging, and electron depth calculation to discover the mechanisms of the degradation and their effects on the TEEY of the material.

引用

页码：191 / 198

页数：8

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