Improved Output Power of GaN-based Blue LEDs by Forming Air Voids on Ar-Implanted Sapphire Substrate

被引:13
作者
Sheu, Jinn-Kong [1 ,2 ]
Yeh, Yu-Hsiang [1 ,2 ]
Tu, Shang-Ju [1 ,2 ]
Lee, Ming-Lun [3 ]
Chen, P. C. [1 ,2 ]
Lai, Wei-Chih [1 ,2 ]
机构
[1] Natl Cheng Kung Univ, Dept Photon, Adv Optoelect Technol Ctr, Tainan 70101, Taiwan
[2] Natl Cheng Kung Univ, Res Ctr Energy Technol & Strategy, Tainan 70101, Taiwan
[3] Southern Taiwan Univ Sci & Technol, Dept Electroopt Engn, Tainan 71005, Taiwan
关键词
air voids; Ar-implanted sapphire; lateral growth; LIGHT-EMITTING-DIODES; ESD CHARACTERISTICS; LATERAL OVERGROWTH; ULTRAVIOLET INGAN; SURFACE; DAMAGE;
D O I
10.1109/JLT.2013.2247740
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper investigates GaN-based blue light-emitting diodes (LEDs) grown on sapphire substrates with selective-area Ar-ion implantation. The GaN-based epitaxial layers grown on the Ar-implanted sapphire substrates (Ar-ISS) exhibited selective growth and subsequent lateral growth because of different lattice constants between the implantation and implantation-free regions. As a result, air voids were formed at the GaN/sapphire interface, above the implanted regions and below the active layers of LEDs. We proposed the GaN layer growth mechanisms on the Ar-ISS, and characterized the LEDs with embedded air voids at the GaN/sapphire interface. Using a 20-mA current injection, the light output of the experimental LEDs was found to be 15% greater than that of conventional LEDs. This enhancement can be attributed to the light scattering at the textured GaN/air void interfaces, which increases the probability of photons escaping from the LEDs.
引用
收藏
页码:1318 / 1322
页数:5
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