Contribution of a New Generation Field-Emission Scanning Electron Microscope in the Understanding of a 2099 Al-Li Alloy

被引:18
作者
Brodusch, Nicolas [1 ]
Trudeau, Michel [2 ]
Michaud, Pierre [1 ]
Rodrigue, Lisa [2 ]
Boselli, Julien [3 ]
Gauvin, Raynald [1 ]
机构
[1] McGill Univ, Min & Mat Dept, Montreal, PQ H3A 0C5, Canada
[2] Inst Rech Hydro Quebec, Varennes, PQ J3X 1S1, Canada
[3] ALCOA Inc, Alcoa Ctr, PA 15069 USA
基金
加拿大自然科学与工程研究理事会;
关键词
electron microscopy; FE-SEM; SEM; TEM; STEM; BSE; microanalysis; Monte Carlo; aluminum alloy; X-RAY; STEM; RESOLUTION; CONTRAST; DETECTOR; IMAGES;
D O I
10.1017/S143192761200150X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Aluminum-lithium alloys are widespread in the aerospace industry. The new 2099 and 2199 alloys provide improved properties, but their microstructure and texture are not well known. This article describes how state-of-the-art field-emission scanning electron microscopy (FE-SEM) can contribute to the characterization of the 2099 aluminum-lithium alloy and metallic alloys in general. Investigations were carried out on bulk and thinned samples. Backscattered electron imaging at 3 kV and scanning transmission electron microscope imaging at 30 kV along with highly efficient microanalysis permitted correlation of experimental and expected structures. Although our results confirm previous studies, this work points out possible substitutions of Mg and Zn with Li, Al, and Cu in the T-1 precipitates. Zinc and magnesium are also present in "rice grain"-shaped precipitates at the grain boundaries. The versatility of the FE-SEM is highlighted as it provides information in the macro- and microscales with relevant details. Its ability to probe the distribution of precipitates from nano- to microsizes throughout the matrix makes FE-SEM an essential technique for the characterization of metallic alloys.
引用
收藏
页码:1393 / 1409
页数:17
相关论文
共 45 条
[1]  
[Anonymous], 1998, SCAN ELECTRON MICROS, DOI 10.1007/978-3-540-38967-5_4
[2]  
Beaman DR., 1975, PHYSICAL ASPECTS ELE, P47
[3]  
BENOIT D., 1989, MICROANALYSE SONDE E, pA1
[4]  
CANOVIC S., 2008, J PHYS C SER, V126
[5]  
CHARLOT F., 2008, MICROSCOPIE ELECT BA, P13
[6]   Atomic structure of T1 precipitates in Al-Li-Cu alloys revisited with HAADF-STEM imaging and small-angle X-ray scattering [J].
Donnadieu, P. ;
Shao, Y. ;
De Geuser, F. ;
Botton, G. A. ;
Lazar, S. ;
Cheynet, M. ;
de Boissieu, M. ;
Deschamps, A. .
ACTA MATERIALIA, 2011, 59 (02) :462-472
[7]  
Erdman N., 2009, Advanced Materials & Processes, V167, P28
[8]   QUANTIFICATION OF SPHERICAL INCLUSIONS IN THE SCANNING ELECTRON-MICROSCOPE USING MONTE-CARLO SIMULATIONS [J].
GAUVIN, R ;
HOVINGTON, P ;
DROUIN, D .
SCANNING, 1995, 17 (04) :202-219
[9]   MC X-Ray, a New Monte Carlo Program for Quantitative X-Ray Microanalysis of Real Materials [J].
Gauvin, Raynald ;
Michaud, Pierre .
MICROSCOPY AND MICROANALYSIS, 2009, 15 :488-489
[10]  
Giummarra C., 2007, P LIGHT METALS TECHN