Externally induced VCO phase noise

被引：0
|
作者：
Colin, D [1 ]
机构：
[1] Micronet Wireless, Hudson, NH USA
来源：
MICROWAVE JOURNAL | 2002年 / 45卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This article describes the degradation of VCO phase noise due to noise on tuning and supply lines, particularly from tuning source resistance and supply voltage regulators.
引用
收藏
页码：20 / +
页数：8
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