Reducing variability in inclined-plane tracking test results

被引：7

作者：

Alghamdi, ASG

Auckland, DW

Risino, AJ

Varlow, BR

机构：

[1] Division of Electrical Engineering, School of Engineering, University of Manchester

来源：

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 1996年 / 3卷 / 03期

关键词：

D O I：

10.1109/94.506218

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Factors which cause variability in the results of inclined-plane tracking tests have been investigated. The effects of introducing shunt or stray capacitance across the test specimen, or of varying the contaminant now rate, are measured. The discharge energy to the time of observation of initial damage shows less variability than the time-to-track criterion, and may be a more appropriate criterion for comparing the track resistance of materials.

引用

页码：439 / 443

页数：5