Separation modes in microcontacts identified by the rate dependence of the pull-off force

被引：14

作者：

Chen, L. ^{[1
]}

McGruer, N. E. ^{[2
]}

Adams, G. G. ^{[2
]}

Du, Y. ^{[3
]}

机构：

[1] RF Micro Devices Inc, Charlotte, NC 28269 USA

[2] Northeastern Univ, Boston, MA 02115 USA

[3] Qualcomm Corp, San Jose, CA 95134 USA

来源：

APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 05期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.2967855

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report the observation of two distinct modes of rate-dependent behavior during contact cycling tests. One is a higher pull-off force at low cycling rates and the other is a higher pull-off force at high cycling rates. Subsequent investigation of these contacts using scanning electron microscopy (SEM) demonstrates that these two rate-dependent modes can be related to brittle and ductile separation modes. The former behavior is indicative of brittle separation, whereas the latter accompanies ductile separation. Thus by monitoring the rate dependence of the pull-off force, the type of separation mode can be identified during cycling without interrupting the test to perform SEM. (C) 2008 American Institute of Physics.

引用

页数：3

共 11 条

[1] Quantum properties of atomic-sized conductors [J].