Combinatorial Reliability Analysis of Warm-Standby Systems with Imperfect Fault Coverage

被引:0
|
作者
Tannous, O. [1 ]
Xing, L. [1 ]
Peng, R. [2 ]
Xie, M. [3 ,4 ]
机构
[1] Univ Massachusetts, Dept Elect & Comp Eng, Dartmouth, NS, Canada
[2] Univ Sci & Technol, Dongling Sch Econ & Management, Beijing, Peoples R China
[3] City Univ Hong Kong, Dept Syst Engn & Engn Management, Hong Kong, Hong Kong, Peoples R China
[4] Natl Univ Singapore, Dept Ind & Syst Engn, Singapore 117548, Singapore
基金
美国国家科学基金会;
关键词
Warm-standby system; dynamic fault tree (DFT); time dependence; sequential multistate decision diagram (SMDD); imperfect fault coverage (IPC); REPAIRABLE SYSTEM; REBOOT;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Warm Standby redundancies are used for improving the reliability in various applications requiring a fast system restoration and minimal energy consumption. Warm-standby redundancies introduce sequential dependent failure behavior between the online unit and the standby units; in particular, failure rates of the standby units change after replacing the on-line faulty unit. Moreover, when the system components are subject to uncovered/undetected fault, the entire system fails despite the presence of remaining redundancies. This paper models the reliability of 1-out-n warm-standby sparing systems subject to imperfect fault coverage based on Sequential Multistate Decision Diagrams (SMDD). The proposed method can overcome some limitations of existing works on warm-standby systems with imperfect fault coverage, such as assuming exponential time-to-failure distribution for all the system components or considering only one warm standby unit. An illustrative example is given to show advantages and applications of the proposed SMDD-based method.
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页码:60 / +
页数:2
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