Self-Repairing Hybrid Adder With Hot-Standby Topology Using Fault-Localization

被引:8
作者
Akbar, Muhammad Ali [1 ]
Wang, Bo [1 ]
Bermak, Amine [1 ]
机构
[1] Hamad Bin Khalifa Univ, Coll Sci & Engn, Div Informat & Comp Technol, Doha 34110, Qatar
关键词
Adders; Circuit faults; Fault detection; Tunneling magnetoresistance; Delays; Transistors; Hardware; Self-repairing adder; fault localization; hybrid adder; real-time self-repairing; CARRY-SELECT ADDER; ERROR-DETECTION; TOLERANCE;
D O I
10.1109/ACCESS.2020.3016427
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Effective self-repairing can be achieved if the fault along with its exact location can be determined. In this paper, a self-repairing hybrid adder is proposed with fault localization. It uses the advantages of ripple carry adder and carry-select adder to reduce the delay and area overhead. The proposed adder reduces the transistor count by 115% to 76.76% as compared to the existing self-checking carry-select adders. Moreover, the proposed design can detect and localize multiple faults. The fault-recovery is achieved by using the hot-standby approach in which the faulty module is replaced by a functioning module at run-time. In case of 3 consecutive faults, the probability of fault recovery has been found to be 96.1% for a 64-bit adder with 8 blocks, where each block has 9 full adders.
引用
收藏
页码:150051 / 150058
页数:8
相关论文
共 20 条
  • [1] Comments on "Self-Checking Carry-Select Adder Design Based on Two-Rail Encoding"
    Akbar, Muhammad Ali
    Lee, Jeong-A
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2014, 61 (07) : 2212 - 2214
  • [2] Achieving fault-tolerance by shifted and rotated operands in TMR non-diverse ALUs
    Alderighi, M
    D'Angelo, S
    Metra, C
    Sechi, GR
    [J]. IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, 2000, : 155 - 163
  • [3] [Anonymous], 2012, P AMER CONTR CONF
  • [4] [Anonymous], 2012, 2012 INT C FIELDPR
  • [5] [Anonymous], 2009, P 2009 12 EUR C DIG, DOI DOI 10.1109/DSD.2009.238
  • [6] [Anonymous], 2013, 16 EUR C DIG SYST, DOI DOI 10.1109/DSD.2013.96
  • [7] Fault localization, error correction, and graceful degradation in Radix 2 Signed Digit-based adders
    Cardarilli, GC
    Ottavi, M
    Pontarelli, S
    Re, M
    Salsano, A
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 2006, 55 (05) : 534 - 540
  • [8] Basic mechanisms and modeling of single-event upset in digital microelectronics
    Dodd, PE
    Massengill, LW
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (03) : 583 - 602
  • [9] The dawning of the autonomic computing era
    Ganek, AG
    Corbi, TA
    [J]. IBM SYSTEMS JOURNAL, 2003, 42 (01) : 5 - 18
  • [10] Concurrent Error Detectable Carry Select Adder with Easy Testability
    Kito, Nobutaka
    Takagi, Naofumi
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 2019, 68 (07) : 1105 - 1110