机构:
Univ Texas Austin, Texas Mat Inst, Dept Mech Engn, Austin, TX 78712 USATexas Instruments Inc, Dallas, TX 75243 USA
Li, Xuesong
[2
]
Han, Boyang
论文数: 0引用数: 0
h-index: 0
机构:
Univ Texas Austin, Texas Mat Inst, Dept Mech Engn, Austin, TX 78712 USATexas Instruments Inc, Dallas, TX 75243 USA
Han, Boyang
[2
]
Magnuson, Carl
论文数: 0引用数: 0
h-index: 0
机构:
Univ Texas Austin, Texas Mat Inst, Dept Mech Engn, Austin, TX 78712 USATexas Instruments Inc, Dallas, TX 75243 USA
Magnuson, Carl
[2
]
Cai, Weiwei
论文数: 0引用数: 0
h-index: 0
机构:
Univ Texas Austin, Texas Mat Inst, Dept Mech Engn, Austin, TX 78712 USATexas Instruments Inc, Dallas, TX 75243 USA
Cai, Weiwei
[2
]
Zhu, Yanwu
论文数: 0引用数: 0
h-index: 0
机构:
Univ Texas Austin, Texas Mat Inst, Dept Mech Engn, Austin, TX 78712 USATexas Instruments Inc, Dallas, TX 75243 USA
Zhu, Yanwu
[2
]
Ruoff, Rodney S.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Texas Austin, Texas Mat Inst, Dept Mech Engn, Austin, TX 78712 USATexas Instruments Inc, Dallas, TX 75243 USA
Ruoff, Rodney S.
[2
]
机构:
[1] Texas Instruments Inc, Dallas, TX 75243 USA
[2] Univ Texas Austin, Texas Mat Inst, Dept Mech Engn, Austin, TX 78712 USA
来源:
GRAPHENE, GE/III-V, AND EMERGING MATERIALS FOR POST-CMOS APPLICATIONS 2
|
2010年
/
28卷
/
05期
关键词:
FILMS;
D O I:
10.1149/1.3367942
中图分类号:
O646 [电化学、电解、磁化学];
学科分类号:
081704 ;
摘要:
Growth of high quality graphene is the basis for the successful demonstration and reduction to practice of electronic devices and transparent conductive electrodes. To date the highest quality devices have been fabricated on graphene exfoliated from natural graphite or Kish graphite, unfortunately this source of graphene is not scalable to sizes required by manufacturing processes. We used chemical vapor deposition (CVD) to grow monolayer graphite or graphene on large area Cu substrates. This technique by its nature is scalable to sizes that are compatible to almost any size requirement. We report on the improvement of the physical properties of graphene on Cu through basic understanding of the growth kinetics. We found that defects associated with the Raman D-band can be reduced by changing the growth process conditions and the sheet resistance is reduced as the D-band defects are reduced.
机构:
Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, EnglandUniv Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England
Geim, A. K.
Novoselov, K. S.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, EnglandUniv Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England
机构:
Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, EnglandUniv Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England
Geim, A. K.
Novoselov, K. S.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, EnglandUniv Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England