IBM experiments in soft fails in computer electronics (1978-1994)

被引：204
作者：
Ziegler, JF
Curtis, HW
Muhlfeld, HP
Montrose, CJ
Chin, B
Nicewicz, M
Russell, CA
Wang, WY
Freeman, LB
Hosier, P
LaFave, LE
Walsh, JL
Orro, JM
Unger, GJ
Ross, JM
OGorman, TJ
Messina, B
Sullivan, TD
Sykes, AJ
Yourke, H
Enger, TA
Tolat, V
Scott, TS
Taber, AH
Sussman, RJ
Klein, WA
Wahaus, CW
机构：
[1] IBM CORP, MICROELECTR DIV, E FISHKILL FACIL, HOPEWELL JCT, NY 12533 USA
[2] IBM CORP, MICROELECTR DIV, BURLINGTON FACIL, ESSEX JCT, VT 05452 USA
[3] IBM CORP, SYST TECHNOL & ARCHITECTURE DIV, AUSTIN, TX 78758 USA
[4] PERSONAL COMP CO, RES TRIANGLE PK, NC 27709 USA
[5] IBM SYST, DIV 390, POUGHKEEPSIE, NY 12601 USA
[6] LORAL FED SYST CO, OSWEGO, NY 13827 USA
[7] IBM CORP, SOMERS, NY 10589 USA
来源：
IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1996年 / 40卷 / 01期
关键词：
D O I：
10.1147/rd.401.0003
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.
引用
收藏
页码：3 / 18
页数：16
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