Quantification for 3D micro X-ray fluorescence

被引：45

作者：

Mantouvalou, Ioanna ^{[1
]}

Malzer, Wolfgang ^{[1
]}

Kanngiesser, Birgit ^{[1
]}

机构：

[1] Tech Univ Berlin, Inst Opt & Atom Phys, D-10623 Berlin, Germany

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2012年 / 77卷

关键词：

Quantification for 3D Micro-XRF; Confocal setup; Depth profiling; Probing site selection; 3D mapping; XRF; RECONSTRUCTION; SPECIATION; OBJECTS;

D O I：

10.1016/j.sab.2012.08.002

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

3D micro X-ray fluorescence analysis (3D Micro-XRF) is a non-destructive method for the investigation of elemental compositions of specimens with which three-dimensionally resolved information can be obtained. This is rendered possible through the formation of a probing volume resulting from the overlap of a condensed X-ray beam and the acceptance of a polycapillary lens in front of an energy-dispersive detector. Various setup schemes have been developed in the last years, which can be divided into synchrotron instrumentation and X-ray tube based spectrometers. Established in 2003/2004 numerous applications have been published up until now. Quantification of data though is still a topic of considerable interest and has been reported only for limited number of publications. This review aims to give an overview of work on quantitative 3D Micro-XRF. As the method can be applied with adapted setups to a variety of analytical problems, quantification also has to be flexible and different schemes have been developed. (C) 2012 Elsevier B.V. All rights reserved.

引用

收藏

页码：9 / 18

页数：10

相关论文

共 32 条

[21] In situ identification of a CAI candidate in 81P/Wild 2 cometary dust by confocal high resolution synchrotron X-ray fluorescence [J].

Schmitz, Sylvia ;

Brenker, Frank E. ;

Schoonjans, Tom ;

Vekemans, Bart ;

Silversmit, Geert ;

Vincze, Laszlo ;

Burghammer, Manfred ;

Riekel, Christian .

GEOCHIMICA ET COSMOCHIMICA ACTA, 2009, 73 (18) :5483-5492

[22] Fundamental parameter based quantification algorithm for confocal nano-X-ray fluorescence analysis [J].

Schoonjans, Tom ;

Silversmit, Geert ;

Vekemans, Bart ;

Schmitz, Sylvia ;

Burghammer, Manfred ;

Riekel, Christian ;

Brenker, Frank E. ;

Vincze, Laszlo .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2012, 67 :32-42

[23] Three-Dimensional Fe Speciation of an Inclusion Cloud within an Ultradeep Diamond by Confocal μ-X-ray Absorption Near Edge Structure: Evidence for Late Stage Overprint [J].

Silversmit, Geert ;

Vekemans, Bart ;

Appel, Karen ;

Schmitz, Sylvia ;

Schoonjans, Tom ;

Brenker, Frank E. ;

Kaminsky, Felix ;

Vincze, Laszlo .

ANALYTICAL CHEMISTRY, 2011, 83 (16) :6294-6299

[24] Confocal μ-XRF depth analysis of paint layers [J].

Smit, Z ;

Janssens, K ;

Proost, K ;

Langus, I .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2004, 219 :35-40

[25] Secondary Fluorescence Enhancement in Confocal X-ray Microscopy Analysis [J].

Sokaras, Dimosthenis ;

Karydas, Andreas-Germanos .

ANALYTICAL CHEMISTRY, 2009, 81 (12) :4946-4954

[26] A multiplatform code for the analysis of energy-dispersive X-ray fluorescence spectra [J].

Sole, V. A. ;

Papillon, E. ;

Cotte, M. ;

Walter, Ph. ;

Susini, J. .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2007, 62 (01) :63-68

[27] Quantitative analysis of single aerosol particles with confocal micro-X-ray fluorescence spectrometer [J].

Sun, Tianxi ;

Liu, Zhiguo ;

Li, Yude ;

Lin, Xiaoyan ;

Wang, Guangfu ;

Zhu, Guanghua ;

Xu, Qing ;

Luo, Ping ;

Pan, Qiuli ;

Liu, Hui ;

Ding, Xunliang .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2010, 622 (01) :295-297

[28] Processing of three-dimensional microscopic X-ray fluorescence data [J].

Vekemans, B ;

Vincze, L ;

Brenker, FE ;

Adams, F .

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2004, 19 (10) :1302-1308

[29] Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging [J].

Vincze, L ;

Vekemans, B ;

Brenker, FE ;

Falkenberg, G ;

Rickers, K ;

Somogyi, A ;

Kersten, M ;

Adams, F .

ANALYTICAL CHEMISTRY, 2004, 76 (22) :6786-6791

[30] Provenance studies on Dead Sea scrolls parchment by means of quantitative micro-XRF [J].

Wolff, Timo ;

Rabin, Ira ;

Mantouvalou, Ioanna ;

Kanngiesser, Birgit ;

Malzer, Wolfgang ;

Kindzorra, Emanuel ;

Hahn, Oliver .

ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 2012, 402 (04) :1493-1503

← 1 2 3 4 →