Site-speciric, cross-sectional imaging of biomaterials and the cell/biomaterial interface using focused ion beam/scanning electron microscopy

被引：2

作者：

Edwards, H. K. ^{[1
]}

Coe, S. C. ^{[1
]}

Fay, M. W.

Scotchford, C. A. ^{[1
]}

Grant, D. M. ^{[1
]}

Brown, P. D. ^{[1
]}

机构：

[1] Univ Nottingham, Sch Mech Mat & Mfg Engn, Univ Pk, Nottingham NG7 2RD, England

来源：

EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007 | 2008年 / 126卷

基金：

英国工程与自然科学研究理事会;

关键词：

FOCAL ADHESION SITES; BONE; CELLS;

D O I：

10.1088/1742-6596/126/1/012097

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Focused ion beam / scanning electron microscopy (FIBSEM) procedures are examined for the sectioning of biological cell / biomedical implant materials. Conventional site-specific lift-out techniques enable the structural characterisation of hydroxyapatite/Ti coatings. Cryo-FIBSEM procedures, as used to investigate human osteoblasts/hydroxyapatite/Ti structures, emphasise the need for the repeated deposition of coating layers to protect such delicate structures and to minimise beam curtaining effects.

引用

页数：4

共 11 条

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